A 1.6pJ/b 65Gb/s Si-Dielectric-Waveguide based Multi-Mode Multi-Drop sub-THz Interconnect in 65nm CMOS.

Xuan Ding Hai Yu Sajjad Sabbaghi Qun Jane Gu

Published in: CICC (2023)

Keyphrases

high speed
metal oxide
waveguide
gate dielectrics
high data rate
leakage current
low voltage
low power
dielectric constant
real time
power consumption
nm technology
si sio
electrical properties
cmos technology
silicon on insulator
low cost
power dissipation
power supply
high density
parallel processing