Transparent testing for intra-word memory faults.
Ioannis VoyiatzisCostas EfstathiouCleo SgouropoulouPublished in: IDT (2013)
Keyphrases
- test cases
- fault model
- memory requirements
- fault detection
- memory usage
- computing power
- co occurrence
- word meaning
- memory space
- test sequences
- noun phrases
- linguistic information
- n gram
- abnormal events
- test generation
- natural language text
- word recognition
- limited memory
- random access
- database systems
- fault diagnosis
- information extraction
- control system
- keywords