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Influence of surface states on the reverse and noise properties of silicon power diodes.
Václav Papez
Jirí Hájek
B. Kojecký
Published in:
IET Circuits Devices Syst. (2014)
Keyphrases
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high density
low cost
power consumption
signal to noise ratio
three dimensional
principal curvatures
registration errors
gallium arsenide
si sio
silicon dioxide
semiconductor devices
power management
surface registration
surface model
noise model
high speed
d objects
hidden markov models