PRINCIPAL CURVATURES
Experts
- Helmut Pottmann
- Tian Ma
- Cai-Yun Li
- Yu-Kun Lai
- Yongcheng Zhou
- Akitsugu Nadai
- Jean-Marie Morvan
- Martin Ritz
- Shi-Min Hu
- Erik M. Bollt
- Jörg Peters
- Ren-Hong Wang
- Liming Chen
- Chun-Gang Zhu
- Gerald E. Farin
- Thomas W. Sederberg
- Victoria Interrante
- Piet W. Verbeek
- Eyal Hameiri
- Masaki Ikeda
- Andrew Spek
- Jérémy Levallois
- José Carlos del Toro Lasanta
- David Cohen-Steiner
- Hiromi T. Tanaka
- Sylvain Fischer
- Jacques-Olivier Lachaud
- Huibin Li
- Toshihiko Umehara
- Sarina Meyer
- Tomislav Pribanic
- Yonghui Li
- Lucas J. van Vliet
- Elaine Cohen
- Florian Lux
- Yong-Liang Yang
- Eric Baum
- Xiuzi Ye
- Shree K. Nayar
Venues
- Comput. Aided Geom. Des.
- CoRR
- Comput. Aided Des.
- IROS
- IGARSS
- Sensors
- ICCV
- Comput. Graph.
- SIAM J. Appl. Math.
- Symmetry
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICRA
- CAD/Graphics
- IEEE Trans. Vis. Comput. Graph.
- IEEE Visualization
- Comput. Graph. Forum
- 3DIM
- ICPR (1)
- ICIP
- Graph. Model.
- Vis. Comput.
- GMP
- Appl. Math. Comput.
- J. Appl. Math.
- ACIVS
- DGCI
- Adv. Comput. Math.
- SCG
- J. Comput. Appl. Math.
- Scale-Space
- IEEE Access
- CVGIP Graph. Model. Image Process.
- IEEE Wirel. Commun. Lett.
- 3DPVT
- NEMS
- Signal Process.
- IMA Conference on the Mathematics of Surfaces
- IEEE Commun. Lett.
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