B. Kojecký

Publication Activity (10 Years)

Years Active: 2003-2014
Publications (10 Years): 0

Top Topics

Semiconductor Devices

Measurement Error

Top Venues

IET Circuits Devices Syst.

Microelectron. Reliab.

Publications

Václav Papez, Jirí Hájek, B. Kojecký
Influence of surface states on the reverse and noise properties of silicon power diodes. IET Circuits Devices Syst. 8 (3) (2014)
Jirí Hájek, Václav Papez, B. Kojecký
Investigation of flicker noise in silicon diodes under reverse bias. Microelectron. Reliab. 52 (3) (2012)
Václav Papez, B. Kojecký, D. Sámal
Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification. Microelectron. J. 39 (6) (2008)
B. Kojecký, Václav Papez, D. Sámal
Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectron. J. 37 (3) (2006)
Václav Papez, B. Kojecký, J. Kozísek, J. Hejhal
Transient effects on high voltage diode stack under reverse bias. Microelectron. Reliab. 43 (4) (2003)