Investigation of flicker noise in silicon diodes under reverse bias.

Jirí Hájek Václav Papez B. Kojecký

Published in: Microelectron. Reliab. (2012)

Keyphrases

high density
noise level
semiconductor devices
missing data
signal to noise ratio
low cost
noise reduction
gaussian noise
random noise
steady state
noisy data
image noise
adverse effect
image restoration
image sequences
noise model
measurement error
low variance
data sets