SURFACE MODEL
Experts
- Guoyan Zheng
- Hans-Peter Seidel
- Qingqing Wu
- Tamal K. Dey
- Yuanwei Liu
- Edwin R. Hancock
- Jörg Peters
- Hong Qin
- Bernhard Preim
- Jeff Erickson
- Marco Di Renzo
- Pierre Alliez
- Leif Kobbelt
- H. Vincent Poor
- Xiao Dong
- Wenping Wang
- Joachim Giesen
- Nassir Navab
- Lutz-Peter Nolte
- Luiz Velho
- Wen Wang
- Sonia Pérez-Díaz
- Andrés Iglesias
- Mathieu Desbrun
- Daniel Cohen-Or
- James F. O'Brien
- Bernd Hamann
- Falai Chen
- Miguel Ángel González Ballester
- Ron Goldman
- Josef Schicho
- Tao Ju
- Ying-Chang Liang
- Markus H. Gross
- Hujun Bao
- Hans Hagen
- Zhu Han
- Cunhua Pan
- Denis Zorin
Venues
- CoRR
- Remote. Sens.
- Sensors
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Aided Des.
- Comput. Aided Geom. Des.
- IEEE Access
- Comput. Graph. Forum
- ACM Trans. Graph.
- CVPR
- ICRA
- J. Comput. Phys.
- Vis. Comput.
- Comput. Graph.
- ICCV
- IEEE Trans. Biomed. Eng.
- EMBC
- IEEE Geosci. Remote. Sens. Lett.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Medical Imaging: Image-Guided Procedures
- IEEE Trans. Instrum. Meas.
- IROS
- Medical Imaging: Image Processing
- IEEE Trans. Medical Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- Appl. Math. Comput.
- J. Comput. Chem.
- IEEE Trans. Vis. Comput. Graph.
- IEEE Wirel. Commun. Lett.
- Symmetry
- ISBI
- SIAM J. Math. Anal.
- IEEE Visualization
- SIGGRAPH
- NEMS
- Discret. Comput. Geom.
- SCG
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