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Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability.

Masato NakasatoSatoshi OhtakeKewal K. SalujaHideo Fujiwara
Published in: IEICE Trans. Inf. Syst. (2007)
Keyphrases
  • test generation
  • knowledge management
  • knowledge base
  • test cases
  • test sequences
  • multi agent
  • image data
  • databases
  • analog circuits
  • mutation testing