Carrier Surface Scattering in Silicon Inversion Layers.

Frank F. Fang Sol Triebwasser

Published in: IBM J. Res. Dev. (1964)

Keyphrases

si sio
silicon dioxide
three dimensional
space charge
low cost
surface reconstruction
object surface
electron microscope
gallium arsenide
high speed
range data
surface features
shape recovery
subsurface scattering
light transport
image reconstruction
surface shape
smooth surfaces
free form
high density
image sequences