SURFACE FEATURES
Experts
- Qingqing Wu
- Ying-Chang Liang
- Jörg Peters
- Jeff Erickson
- Gershon Elber
- Cunhua Pan
- Yuanwei Liu
- Wen Wang
- Kestutis Karciauskas
- Jianmin Zheng
- Hans-Peter Seidel
- Rui Zhang
- Falai Chen
- Robert B. Fisher
- Myung-Soo Kim
- Kun-Shan Chen
- Paul S. Chang
- Tamal K. Dey
- Mohammed Bennamoun
- Shinichi Hirai
- J. Rafael Sendra
- Xianfeng Gu
- Thomas W. Sederberg
- H. Vincent Poor
- Jun-Hai Yong
- J. Edward Colgate
- Joel T. Johnson
- Fuhua Cheng
- Masaya Takasaki
- Micha Sharir
- Hui Tian
- Wanli Ni
- Xiaohu Guo
- Emil Björnson
- Shubham Tulsiani
- Wei Zeng
- Atsushi Mitani
- Marco Di Renzo
- Wenping Wang
Venues
- CoRR
- Sensors
- IGARSS
- Remote. Sens.
- ICRA
- IEEE Trans. Geosci. Remote. Sens.
- ACM Trans. Graph.
- IEEE Access
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- Comput. Graph. Forum
- CVPR
- IROS
- Vis. Comput.
- NEMS
- Appl. Math. Comput.
- IEEE Geosci. Remote. Sens. Lett.
- J. Comput. Phys.
- ICTON
- Comput. Graph.
- EMBC
- J. Comput. Chem.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- IEEE Trans. Instrum. Meas.
- SIAM J. Math. Anal.
- SIAM J. Appl. Math.
- IMA Conference on the Mathematics of Surfaces
- Int. J. Autom. Technol.
- IEEE Wirel. Commun. Lett.
- IEICE Trans. Electron.
- CHI
- IEEE Trans. Biomed. Eng.
- ICPR
- IEEE Trans. Vis. Comput. Graph.
- IEEE Computer Graphics and Applications
- ICPR (1)
- MVA
- Discret. Comput. Geom.
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