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Experts
- Edwin R. Hancock
- Jörg Peters
- Hans-Peter Seidel
- Hong Qin
- Jianmin Zheng
- Helmut Pottmann
- Qingqing Wu
- Jianguang Wen
- Wenping Wang
- Shunlin Liang
- Chandrajit L. Bajaj
- Atsuhiro Nakamoto
- Thomas W. Sederberg
- Tamal K. Dey
- Luc Van Gool
- Bert Jüttler
- Qing Xiao
- Dongqin You
- Guoliang Xu
- Gabriel Taubin
- Pascal Fua
- Daniel Cohen-Or
- Luiz Velho
- Qiang Liu
- Stefanie Hahmann
- Steven W. Zucker
- Paul E. Debevec
- Mahta Moghaddam
- Charlie C. L. Wang
- Ko Nishino
- Myung-Soo Kim
- Hujun Bao
- Ahmad H. Nasri
- Jean-Louis Roujean
- Joachim Giesen
- Fuhua Cheng
- Jeff Erickson
- Andrew Zisserman
- Hongliang Zhang
Venues
- CoRR
- IGARSS
- Sensors
- Comput. Aided Geom. Des.
- Remote. Sens.
- Comput. Aided Des.
- CVPR
- ACM Trans. Graph.
- Comput. Graph. Forum
- IEEE Trans. Geosci. Remote. Sens.
- ICCV
- Vis. Comput.
- ICRA
- Comput. Graph.
- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Comput. Phys.
- IEEE Trans. Vis. Comput. Graph.
- Appl. Math. Comput.
- ICIP
- SIGGRAPH
- EMBC
- IROS
- Discret. Comput. Geom.
- IEEE Computer Graphics and Applications
- IEEE Geosci. Remote. Sens. Lett.
- IMR
- Int. J. Comput. Vis.
- BMVC
- Symmetry
- IEEE Trans. Instrum. Meas.
- ICPR
- Comput. Vis. Image Underst.
- IMA Conference on the Mathematics of Surfaces
- Image Vis. Comput.
- GMP
- SCG
- CAD/Graphics
- IEEE Visualization
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