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Experts
- Edwin R. Hancock
- Jörg Peters
- Hans-Peter Seidel
- Hong Qin
- Jianmin Zheng
- Helmut Pottmann
- Jianguang Wen
- Qingqing Wu
- Wenping Wang
- Chandrajit L. Bajaj
- Shunlin Liang
- Atsuhiro Nakamoto
- Luc Van Gool
- Thomas W. Sederberg
- Tamal K. Dey
- Bert Jüttler
- Gabriel Taubin
- Dongqin You
- Qing Xiao
- Pascal Fua
- Luiz Velho
- Daniel Cohen-Or
- Guoliang Xu
- Mahta Moghaddam
- Jean-Louis Roujean
- Ahmad H. Nasri
- Myung-Soo Kim
- Steven W. Zucker
- Hujun Bao
- Qiang Liu
- Paul E. Debevec
- Stefanie Hahmann
- Joachim Giesen
- Charlie C. L. Wang
- Ko Nishino
- Fuhua Cheng
- Jeff Erickson
- Yasuyuki Matsushita
- Hossein Ragheb
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- CVPR
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- ICCV
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- IEEE Access
- IEEE Trans. Pattern Anal. Mach. Intell.
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- IMA Conference on the Mathematics of Surfaces
- GMP
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- IEEE Visualization
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