eFlash memory technology for defect injection and faulty behavior prediction.
Pierre-Didier MaurouxArnaud VirazelAlberto BosioLuigi DililloPatrick GirardSerge PravossoudovitchBenoît GodardGilles FestesLaurent VachezPublished in: ETS (2010)
Keyphrases
- prediction accuracy
- memory requirements
- prediction error
- data processing
- fault diagnosis
- cost effective
- genetic algorithm
- technological advances
- memory space
- prediction model
- information systems
- artificial neural networks
- computational complexity
- human behavior
- case study
- model based diagnosis
- data sets
- prediction algorithm
- defect detection