A 5-to-8-GHz Wideband Miniaturized Dielectric Spectroscopy Chip With $I/Q$ Mismatch Calibration in 65-nm CMOS.
Shunli MaNing LiJunyan RenPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2018)
Keyphrases
- cmos technology
- silicon on insulator
- nm technology
- high speed
- frequency band
- metal oxide semiconductor
- low power
- power consumption
- dielectric constant
- analog vlsi
- clock frequency
- camera calibration
- low cost
- infrared
- circuit design
- inertial measurement unit
- x ray
- cmos image sensor
- low voltage
- ibm power processor
- image sensor
- mixed signal
- focal plane
- single chip
- parallel processing
- power dissipation
- signal to noise ratio
- electron microscopy
- high density
- focal length
- camera parameters
- gate dielectrics
- subband
- high frequency
- integrated circuit
- lens distortion
- microstrip
- electric field
- leakage current
- simulation software
- inertial sensors
- digital signal processing
- multiple cameras
- ultra low power