Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks.

Dimitris Nikolos Haridimos T. Vergos Th. Haniotakis Y. Tsiatouhas

Published in: DATE (1999)

Keyphrases

intellectual property
patent search
fault model
clef ip
fault diagnosis
fault detection
patent documents
e government
patent information
shortest path
fault injection
embedded systems
path length
destination node
prior art
test cases
real time embedded systems
artificial intelligence
software testing
decision making