SKIN DETECTION
Experts
- Stan Z. Li
- Mohamed Daoudi
- Hsin-Liu Cindy Kao
- Wen Gao
- Juan P. Wachs
- Allison M. Okamura
- Thomas S. Huang
- Michal Kawulok
- Ahmed Bouridane
- William R. Provancher
- Abdesselam Bouzerdoum
- Norimichi Tsumura
- Modesto Castrillón Santana
- Hazem M. El-Bakry
- Sergio Escalera
- Xilin Chen
- Douglas Chai
- Raimondo Schettini
- Ravinder Dahiya
- Rehanullah Khan
- Hadi Heidari
- Julian Stöttinger
- Hiroyuki Kajimoto
- Chengjun Liu
- Jakub Nalepa
- Alessandra Lumini
- Vishal M. Patel
- Xiaoou Tang
- Jürgen Steimle
- Mark D. Fairchild
- Vassilis Athitsos
- Rita Cucchiara
- Loris Nanni
- Isabelle Guyon
- Yoshihiro Tanaka
- Yunan Li
- Jun Wan
- Bruno Jedynak
- Richa Singh
Venues
- CoRR
- Sensors
- ICIP
- FG
- Multim. Tools Appl.
- Pattern Recognit.
- ICPR
- IEEE Access
- Color Imaging Conference
- IROS
- ICRA
- EMBC
- SMC
- CVPR
- CHI
- Pattern Recognit. Lett.
- ICASSP
- IEEE Trans. Biomed. Eng.
- IEEE Trans. Image Process.
- IEEE Trans. Instrum. Meas.
- ICME
- CIC
- CVPR Workshops
- Gesture Workshop
- Int. J. Pattern Recognit. Artif. Intell.
- CIARP
- MVA
- ROBIO
- Comput. Vis. Image Underst.
- Image Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- FGR
- CHI Extended Abstracts
- WACV
- ISCAS
- IEEE Trans. Haptics
- Neurocomputing
- AVSS
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