SKIN DETECTION
Experts
- Stan Z. Li
- Mohamed Daoudi
- Hsin-Liu Cindy Kao
- Wen Gao
- Juan P. Wachs
- Thomas S. Huang
- Allison M. Okamura
- Michal Kawulok
- Sergio Escalera
- Raimondo Schettini
- Ahmed Bouridane
- Modesto Castrillón Santana
- Norimichi Tsumura
- Ravinder Dahiya
- Hazem M. El-Bakry
- Douglas Chai
- Abdesselam Bouzerdoum
- William R. Provancher
- Xilin Chen
- Richa Singh
- Vishal M. Patel
- Julian Stöttinger
- Rita Cucchiara
- Alessandra Lumini
- Vassilis Athitsos
- Yunan Li
- Jakub Nalepa
- Mark D. Fairchild
- Hiroyuki Kajimoto
- Loris Nanni
- Gongfa Li
- Rehanullah Khan
- Yoshihiro Tanaka
- Jürgen Steimle
- Vijayan K. Asari
- Xiaoou Tang
- Kamal Chenaoua
- Bruno Jedynak
- Isabelle Guyon
Venues
- CoRR
- Sensors
- ICIP
- FG
- Multim. Tools Appl.
- ICPR
- Pattern Recognit.
- IEEE Access
- Color Imaging Conference
- IROS
- EMBC
- SMC
- ICRA
- CVPR
- CHI
- Pattern Recognit. Lett.
- ICASSP
- IEEE Trans. Image Process.
- IEEE Trans. Biomed. Eng.
- CIC
- ICME
- Gesture Workshop
- CVPR Workshops
- IEEE Trans. Instrum. Meas.
- Int. J. Pattern Recognit. Artif. Intell.
- CIARP
- MVA
- Comput. Vis. Image Underst.
- Image Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- FGR
- ROBIO
- Neurocomputing
- IEEE SENSORS
- IEEE Trans. Haptics
- IJCNN
- ICIP (1)
- J. Electronic Imaging
- ISCAS
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