OBJECT INSTANCES
Experts
- Stian Soiland-Reyes
- Shafin Rahman
- Diego Rodriguez
- Yanchao Yang
- Yukiyasu Domae
- Donghoon Lee
- Sven Behnke
- Xin Huang
- Rui Qian
- Evelina Lamma
- Ryuhei Hamaguchi
- Kaichun Mo
- Lorenzo Torresani
- Marco Gavanelli
- Viviana Bono
- Leonidas J. Guibas
- Townim F. Chowdhury
- Jinwei Gu
- Christian Lenz
- Joana Campos
- Morteza Saberi
- Mete Ozay
- Jan Kautz
- Yake Wei
- Daehyun Kim
- Kishan Sharma
- Chuanyu Pan
- Wim Abbeloos
- Olga Barinova
- Yueqi Duan
- Weiyao Lin
- Tatsuya Harada
- Gedas Bertasius
- Sergio Caccamo
- Ali Cheraghian
- Tim Clark
- Yoshitaka Ushiku
- Ruihua Song
- Lluís Castrejón
Venues
- CoRR
- CVPR
- ICRA
- OOPSLA
- ECOOP
- WACV
- ICPR
- ICCV
- IROS
- Int. J. Comput. Vis.
- CogSci
- IEEE Internet Comput.
- Comput. Vis. Image Underst.
- IEEE Trans. Image Process.
- CSIT
- Dagstuhl Artifacts Ser.
- J. Symb. Log.
- ICME
- POPL
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICASSP
- JCDL
- Pattern Recognit.
- Appl. Categorical Struct.
- ACM SIGSOFT Softw. Eng. Notes
- J. Cogn. Neurosci.
- ACM Multimedia
- Scientometrics
- FUZZ-IEEE
- Ann. Pure Appl. Log.
- WCRE
- MVA
- ACM SIGPLAN Notices
- BMVC
- 3PGCIC
- FPW@SPLASH
- J. Log. Comput.
- ICFP
- ICLP
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