DETECTING AND TRACKING MULTIPLE
Experts
- Nassir Navab
- Gerhard Widmer
- Nasser Kehtarnavaz
- Pengfei Zhu
- Charles Brazier
- Qinghua Hu
- Radu Timofte
- Don Towsley
- John C. S. Lui
- Iljoo Baek
- Mykhaylo Andriluka
- Junzhou Zhao
- Andrey Ignatov
- Dawei Du
- Dong Wang
- Pinghui Wang
- Longyin Wen
- Xiaohong Guan
- Peter H. N. de With
- Bernt Schiele
- Elhadi M. Shakshuki
- Raja Bose
- Vincent Lepetit
- Senem Velipasalar
- Tao Wang
- Jumpei Shimamura
- Rita Cucchiara
- Richard Bowden
- Daisuke Inoue
- Bhaskar Krishnamachari
- Xinguo Yu
- Michael G. Strintzis
- Jiri Matas
- Shuiwang Li
- Cristofer Englund
- Ragunathan Rajkumar
- Dan Zeng
- Wenlong Li
- Zhiguo Cao
Venues
- CoRR
- Sensors
- IEEE Access
- ICASSP
- AVSS
- ICRA
- IROS
- Remote. Sens.
- CVPR
- J. Real Time Image Process.
- Multim. Tools Appl.
- ICIP
- ITSC
- IEEE Trans. Geosci. Remote. Sens.
- EMBC
- ICPR
- Comput. Electron. Agric.
- CVPR Workshops
- IEEE Trans. Intell. Transp. Syst.
- Intelligent Vehicles Symposium
- IEEE Trans. Instrum. Meas.
- Mach. Vis. Appl.
- FUSION
- IGARSS
- BMVC
- ISCAS
- ICCV
- IEEE Robotics Autom. Lett.
- SMC
- Image Vis. Comput.
- ACC
- EUSIPCO
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV Workshops
- Digit. Signal Process.
- MICCAI (2)
- IEEE Trans. Aerosp. Electron. Syst.
- CRV
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