CONSISTENT LABELING
Experts
- Fangwei Zhong
- Yizhou Wang
- Mohan S. Kankanhalli
- Andrea Cavallaro
- Rita Cucchiara
- Kaiqi Huang
- Haibin Ling
- Prabhu Natarajan
- Wilfried Philips
- Mongi A. Abidi
- Chung-Hao Chen
- Andreas F. Koschan
- Yi Yao
- Carlo S. Regazzoni
- Sridha Sridharan
- Marco Camurri
- Mubarak Shah
- Mattias O'Nils
- Clinton Fookes
- Kian Hsiang Low
- Igor Fedorov
- Joachim Denzler
- Chunyuan Liao
- Luca Bertinetto
- Ming-Hsuan Yang
- Yi Zhang
- Klaus Dietmayer
- Heng Fan
- Yanning Zhang
- Bastian Leibe
- Marcus Baum
- Najeem Lawal
- Marc Pollefeys
- Andrea Prati
- Jun-Sik Kim
- Sangjin Hong
- Arun Das
- Simone Calderara
- Davide Scaramuzza
Venues
- CoRR
- Sensors
- IROS
- ICDSC
- IEEE Access
- ICIP
- AVSS
- ICRA
- FUSION
- CVPR Workshops
- Multim. Tools Appl.
- ICASSP
- ACM Multimedia
- CVPR
- Comput. Vis. Image Underst.
- WACV
- IEEE Robotics Autom. Lett.
- IEEE Trans. Image Process.
- ITSC
- BMVC
- AAAI
- EUSIPCO
- Mach. Vis. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- DAGM-Symposium
- DICTA
- ICME
- ICPR
- ICCV
- Image Vis. Comput.
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Trans. Robotics
- ICIP (2)
- IEEE Trans. Consumer Electron.
- VR
- Pattern Recognit.
- Pattern Recognit. Lett.
- Neurocomputing
- IGARSS
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