CONSISTENT LABELING
Experts
- Andrea Cavallaro
- Fangwei Zhong
- Mohan S. Kankanhalli
- Wilfried Philips
- Rita Cucchiara
- Haibin Ling
- Yizhou Wang
- Prabhu Natarajan
- Kaiqi Huang
- Yi Yao
- Mongi A. Abidi
- Marco Camurri
- Mattias O'Nils
- Carlo S. Regazzoni
- Andreas F. Koschan
- Clinton Fookes
- Sridha Sridharan
- Mubarak Shah
- Kian Hsiang Low
- Chung-Hao Chen
- David L. Page
- Davide Scaramuzza
- Chunyuan Liao
- Ming-Hsuan Yang
- Joachim Denzler
- Andrea Prati
- Heng Fan
- Shahram Payandeh
- John N. Carter
- Luca Bertinetto
- Arun Das
- Trong Nghia Hoang
- Najeem Lawal
- Yi Zhang
- Jun-Sik Kim
- Marc Pollefeys
- Yanning Zhang
- Klaus Dietmayer
- Sangjin Hong
Venues
- CoRR
- IROS
- Sensors
- ICDSC
- ICIP
- AVSS
- ICRA
- IEEE Access
- FUSION
- Multim. Tools Appl.
- CVPR Workshops
- ICASSP
- ACM Multimedia
- CVPR
- WACV
- Comput. Vis. Image Underst.
- BMVC
- EUSIPCO
- Mach. Vis. Appl.
- AAAI
- ICCV
- DICTA
- DAGM-Symposium
- ICME
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- ITSC
- ICIP (2)
- Image Vis. Comput.
- IET Image Process.
- Pattern Recognit.
- IEEE Trans. Consumer Electron.
- VR
- IEEE Trans. Circuits Syst. Video Technol.
- Knowl. Based Syst.
- IEEE Trans. Robotics
- Pattern Recognit. Lett.
- MVA
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