CLUTTERED SCENES
Experts
- Emanuele RodolÃ
- Michael M. Bronstein
- Alexander M. Bronstein
- Kensuke Harada
- Makoto Kaneko
- Luca Cosmo
- Dieter Fox
- Yu Xiang
- Andrea Torsello
- Mohammed Bennamoun
- Francesc Moreno-Noguer
- Sven J. Dickinson
- Daniel Cremers
- Costas S. Iliopoulos
- Bastian Leibe
- Frédéric Lerasle
- Yuqi Gong
- Larry S. Davis
- Petr Dolezel
- Alexander Hermans
- Nan Jiang
- Toshio Tsuji
- Xuehui Yu
- Michael S. Langer
- Dominik Stursa
- Naveed Akhtar
- Zhenjun Han
- Salman H. Khan
- Pengwei Xie
- Florian Meyer
- Siang Chen
- Filippo Bergamasco
- Ming Li
- Stan Sclaroff
- Simone Melzi
- Alhayat Ali Mekonnen
- Manal Mohamed
- Rudolph Triebel
- Andrea Albarelli
Venues
- CoRR
- CVPR
- ICRA
- IROS
- IEEE Robotics Autom. Lett.
- ICIP
- ICCV
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Multim. Tools Appl.
- IEEE Access
- Int. J. Comput. Vis.
- IEEE Trans. Image Process.
- Pattern Recognit.
- BMVC
- Comput. Vis. Image Underst.
- Sensors
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- WACV
- CVPR Workshops
- Image Vis. Comput.
- CRV
- ECCV (1)
- ROBIO
- Neurocomputing
- CVPR (1)
- ITSC
- ICCV Workshops
- IEEE Trans. Instrum. Meas.
- ISBI
- MVA
- Humanoids
- Pattern Recognit. Lett.
- ICIP (3)
- ICME
- VISIGRAPP (4: VISAPP)
- SMC
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