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Experts
- Steven J. Ruuth
- Asish Mukhopadhyay
- Colin B. Macdonald
- Marc Alexa
- Ronald D. Haynes
- Micha Sharir
- Timothy M. Chan
- Rüdiger Westermann
- Ian C. T. May
- Anders Adamson
- Mark Kim
- Michiel H. M. Smid
- Benoît Combès
- Yonghuai Liu
- Aly A. Farag
- Sergio Cabello
- Günter Rote
- Marcel Roeloffzen
- Mark de Berg
- Stefan Auer
- Zahed Rahmati
- Thomas Vetter
- Boris Aronov
- Sylvain Prima
- Lionel Ott
- Pablo Pérez-Lantero
- Fahira Afzal Maken
- Bettina Speckmann
- Jun-Hai Yong
- Charles D. Hansen
- Panos Giannopoulos
- Dimitris N. Metaxas
- J. Michael Fitzpatrick
- Christian Knauer
- Riccardo Marin
- Wing-Kai Hon
- Toon Huysmans
- David Eppstein
- Mustafa A. Kishk
Venues
- CoRR
- CCCG
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Graph. Forum
- Comput. Geom.
- Inf. Process. Lett.
- CVPR
- Pattern Recognit. Lett.
- J. Comput. Phys.
- ICRA
- Sensors
- Pattern Recognit.
- IROS
- Comput. Aided Des.
- ACM Trans. Graph.
- Discret. Appl. Math.
- Medical Imaging: Image Processing
- ICIP
- Comput. Aided Geom. Des.
- 3DIM
- FG
- ICCV
- SIAM J. Sci. Comput.
- Comput. Graph.
- J. Math. Imaging Vis.
- IEEE Robotics Autom. Lett.
- SCG
- ICME
- Vis. Comput.
- IEEE Access
- Discret. Comput. Geom.
- Robotics Auton. Syst.
- Comput. Vis. Image Underst.
- ESA
- SODA
- Multim. Tools Appl.
- ICIP (3)
- ROBIO
- VR
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