APPARENT CONTOURS
Experts
- Roberto Cipolla
- Levente Hajder
- Peter J. Giblin
- Joshua Zahl
- Fatih Ulupinar
- Jun Sato
- Kalle Åström
- Ákos Pernek
- Ramakant Nevatia
- Andrew Zisserman
- Kostas Daniilidis
- János Pach
- Richard S. Weiss
- Csaba Kazó
- Andrew Suk
- Imry Kissos
- Mark Kliger
- Mathieu Aubry
- Renaud Marlet
- David Tick
- Xuchong Qiu
- Nicholas R. Gans
- Keigo Watanabe
- Hiroshi Hashimoto
- Darren Engwirda
- Miroslav Treml
- Victor Parque
- Oded Stein
- William Puech
- Pierre-Alain Langlois
- Satoshi Miura
- Fredrik Kahl
- Hongdong Li
- Arun N. Netravali
- Sami S. Brandt
- Jianbo Ye
- Gil Ben-Artzi
- Mubarak Shah
- Phillip N. Azariadis
Venues
- CoRR
- ICCV
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Aided Des.
- BMVC
- Vis. Comput.
- ICRA
- ICIP
- Comput. Aided Geom. Des.
- Image Vis. Comput.
- Comput. Graph.
- IEEE Computer Graphics and Applications
- SIGGRAPH
- WACV
- ICASSP
- ICINCO (2)
- IEICE Trans. Electron.
- Adv. Intell. Syst.
- Multiscale Model. Simul.
- Int. J. Comput. Vis.
- CHI
- EUSIPCO
- IROS
- ECCV (1)
- EMEIT
- SIAM J. Appl. Dyn. Syst.
- Sensors
- Remote. Sens.
- Int. J. Comput. Appl. Technol.
- SMI
- ICPR (1)
- ICIRA (2)
- Int. J. Bifurc. Chaos
- CISP-BMEI
- Appl. Math. Lett.
- Object Representation in Computer Vision
- SMC
- Pattern Recognit.
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