Yiorgos Sfikas

Publication Activity (10 Years)

Years Active: 2009-2024
Publications (10 Years): 9

Top Topics

Textured Surfaces

Defect Detection

Top Venues

Publications

Marina E. Plissiti, Christoforos Papaioannou, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas
Deep Learning Based Detection of Anti-Reflective Obstacles in VLC Systems. ICAIIC (2024)
Christoforos Papaioannou, Marina E. Plissiti, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas
Signal decoding in an NLOS VLC system with the presence of anti-reflective obstacles. BlackSeaCom (2022)
Marina E. Plissiti, Christoforos Papaioannou, Yiorgos Sfikas, Georgios Papatheodorou, Simon-Ilias Poulis, Aristides Efthymiou, Yiorgos Tsiatouhas
An efficient adaptive thresholding scheme for signal decoding in NLOS VLC systems. MeditCom (2021)
Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas
Aging Prediction and Tolerance for the SRAM Memory Cell and Sense Amplifier. J. Electron. Test. 37 (1) (2021)
Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas
Periodic Aging Monitoring in SRAM Sense Amplifiers. IOLTS (2018)
Helen-Maria Dounavi, Yiorgos Sfikas, Yiorgos Tsiatouhas
Aging monitoring in SRAM sense amplifiers. MOCAST (2018)
Yiorgos Sfikas, Yiorgos Tsiatouhas
Variation tolerant BTI monitoring in SRAM cells. IOLTS (2017)
Yiorgos Sfikas, Yiorgos Tsiatouhas
BTI and HCI degradation detection in SRAM cells. MOCAST (2017)
Yiorgos Sfikas, Yiorgos Tsiatouhas
Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs. IEEE Trans. Computers 65 (7) (2016)
Yiorgos Sfikas, Yiorgos Tsiatouhas, Mottaqiallah Taouil, Said Hamdioui
On resistive open defect detection in DRAMs: The charge accumulation effect. ETS (2015)
Yiorgos Sfikas, Yiorgos Tsiatouhas, Said Hamdioui
Layout-Based Refined NPSF Model for DRAM Characterization and Testing. IEEE Trans. Very Large Scale Integr. Syst. 22 (6) (2014)
Yiorgos Sfikas, Yiorgos Tsiatouhas
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing. DDECS (2009)