Login / Signup
Layout-Based Refined NPSF Model for DRAM Characterization and Testing.
Yiorgos Sfikas
Yiorgos Tsiatouhas
Said Hamdioui
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
</>
formal model
mathematical model
computational model
probabilistic model
prior knowledge
cost function
statistical model
markov chain
conceptual model
test data
theoretical framework
em algorithm
neural network
probability distribution
data model
objective function
high level