Yasuo Nakagawa

Publication Activity (10 Years)

Years Active: 1979-2009
Publications (10 Years): 0

Publications

Yuichi Hamamura, Chizu Matsumoto, Yoshiyuki Tsunoda, Koji Kamoda, Yoshio Iwata, Kenji Kanamitsu, Daisuke Fujiki, Fujihiko Kojika, Hiromi Fujita, Yasuo Nakagawa, Shun'ichi Kaneko
Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing. IEICE Trans. Electron. (1) (2009)
Takashi Hiroi, Shunji Maeda, Hitoshi Kubota, Kenji Watanabe, Yasuo Nakagawa
Precise visual inspection for LSI wafer patterns using subpixel image alignment. WACV (1994)
Shree K. Nayar, Yasuo Nakagawa
Shape from Focus. IEEE Trans. Pattern Anal. Mach. Intell. 16 (8) (1994)
Takanori Ninomiya, Kazushi Yoshimura, Mineo Nomoto, Yasuo Nakagawa
Automatic screen-printed circuit pattern inspection using connectivity preserving image reduction and connectivity comparison. ICPR (1) (1992)
Takashi Hiroi, Kazushi Yoshimura, Takanori Ninomiya, Toshimitsu Hamada, Yasuo Nakagawa, Shigeki Mio, Kouichi Karasaki, Hideaki Sasaki
Development of Solder Joint Inspection Method Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection Method. MVA (1992)
Takanori Ninomiya, Yasuo Nakagawa
Precise Position Detection of a Mesh-Backed Printing Screen Based on the Smallest Enclosing Circle Detection. MVA (1990)
Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa
Precise Visual Inspection of LSI Wafer Patterns by Local Perturbation Pattern Matching Algorithm. Systems and Computers in Japan 21 (9) (1990)
Shree K. Nayar, Yasuo Nakagawa
Shape from focus: an effective approach for rough surfaces. ICRA (1990)
Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira, Takanori Ninomiya, Yasuo Nakagawa, Yuzo Taniguchi
Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm. Systems and Computers in Japan 21 (12) (1990)
Takanori Ninomiya, Mineo Nomoto, Yasuo Nakagawa
Automatic 2 1/2 D shape inspection system for via-hole fillings of green sheets by shadow image analysis. ICRA (1989)
Yukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa
Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image Comparison. MVA (1988)
Yasuo Nakagawa, Azriel Rosenfeld
Some experiments on variable thresholding. Pattern Recognit. 11 (3) (1979)
Yasuo Nakagawa, Azriel Rosenfeld
A note on polygonal and elliptical approximation of mechanical parts. Pattern Recognit. 11 (2) (1979)