Shunji Maeda

Publication Activity (10 Years)

Years Active: 1990-2019
Publications (10 Years): 4

Top Topics

Causal Relationships

Power Generation

High Frame Rate

Top Venues

IEEE J. Solid State Circuits

Publications

Kanta Matsubayashi, Takuya Anjiki, Shunji Maeda
Analyzing Causal Relationships of Sensor Data and Infrared Images to Stabilize Garbage Power Generation. ICMLC (2019)
Takuya Anjiki, Kanta Matsubayashi, Shunji Maeda
Utilization of the Infrared Image Capturing Combustion State for Estimating the Steam Flow Aming to Stabilize Garbage Power Generation. ICMLC (2019)
Masami Nakamura, Yuta Aoto, Shunji Maeda
A Basic Study on Railway Facility Extraction Using a Single-Shot Multi-Box Detector. ICMLC (2019)
Yuichi Kato, Takuya Sano, Yusuke Moriyama, Shunji Maeda, Takeshi Yamazaki, Atsushi Nose, Kimiyasu Shiina, Yohtaro Yasu, Ward van der Tempel, Alper Ercan, Yoshiki Ebiko, Daniel Van Nieuwenhove, Shunichi Sukegawa
320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor. IEEE J. Solid State Circuits 53 (4) (2018)
Toshio Asano, Takahiro Kondoh, Shunji Maeda
Unified evaluation method of white uniformity for electronic displays. IECON (2013)
Shunji Maeda, Makoto Ono, Hitoshi Kubota, Mitsuo Nakatani
Precise detection of short-circuit defects on TFT substrate by infrared image matching. Systems and Computers in Japan 30 (12) (1999)
Shunji Maeda, Fumiaki Endo, Hiroshi Makihira, Hitoshi Kubota
Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison. Systems and Computers in Japan 29 (14) (1998)
Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira
Optimum threshold generation for automated visual inspection of large-scale integration wafer patterns. Systems and Computers in Japan 27 (11) (1996)
Takashi Hiroi, Shunji Maeda, Hitoshi Kubota, Kenji Watanabe, Yasuo Nakagawa
Precise visual inspection for LSI wafer patterns using subpixel image alignment. WACV (1994)
Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira, Takanori Ninomiya, Yasuo Nakagawa, Yuzo Taniguchi
Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm. Systems and Computers in Japan 21 (12) (1990)