Precise detection of short-circuit defects on TFT substrate by infrared image matching.
Shunji MaedaMakoto OnoHitoshi KubotaMitsuo NakataniPublished in: Systems and Computers in Japan (1999)
Keyphrases
- infrared
- image matching
- target detection
- short circuit
- infrared imagery
- target detection and tracking
- thermal images
- infrared images
- infrared sensors
- matching algorithm
- multi sensor
- invariant features
- object identification
- image pairs
- computer vision
- image registration
- keypoints
- visible spectrum
- object recognition
- stereo matching
- object detection
- real time
- image retrieval
- illumination variations
- image processing
- thin film
- focal plane
- high resolution
- thermal imaging