INVARIANT FEATURES
Experts
- Jan Flusser
- Chandan Singh
- Arnold W. M. Smeulders
- Ran Tao
- Andrzej Sluzek
- Tomás Suk
- Laura Kovács
- Luc Van Gool
- In-So Kweon
- Jiwu Huang
- Andrew Zisserman
- Huazhong Shu
- Theo Gevers
- Gui-Song Xia
- Hans Burkhardt
- Sungho Kim
- Yue Wang
- Paramesran Raveendran
- Marc W. Howard
- Yang-Sae Moon
- Tieniu Tan
- Jiri Matas
- Roberto Cipolla
- Heung-Kyu Lee
- George A. Papakostas
- Tony Lindeberg
- Isaac Weiss
- Trevor Darrell
- Shih-Fu Chang
- Limin Luo
- Cordelia Schmid
- Mohammed Bennamoun
- Nenghai Yu
- André Platzer
- Salvatore Tabbone
- Yoshua Bengio
- Alberto Sanfeliu
- Mark S. Drew
- Chi-Man Pun
Venues
- CoRR
- ICIP
- CVPR
- ICASSP
- Pattern Recognit.
- ICPR
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- IEEE Access
- Sensors
- ICCV
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- IEEE Trans. Geosci. Remote. Sens.
- IGARSS
- BMVC
- ICRA
- IEEE Geosci. Remote. Sens. Lett.
- Neurocomputing
- J. Electronic Imaging
- IROS
- Image Vis. Comput.
- CVPR Workshops
- Inf. Sci.
- Int. J. Comput. Vis.
- IEEE Trans. Circuits Syst. Video Technol.
- Signal Process.
- AAAI
- ICME
- Comput. Vis. Image Underst.
- IEEE Trans. Signal Process.
- Appl. Math. Comput.
- Symmetry
- WACV
- Vis. Comput.
- EMBC
- CDC
- IJCNN
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