Yaqing Chi

Publication Activity (10 Years)

Years Active: 2010-2022
Publications (10 Years): 12

Top Topics

Cmos Technology

Laparoscopic Surgery

Top Venues

IEICE Electron. Express

Sci. China Inf. Sci.

Publications

Chang Cai, Zehao Wu, Jing Zhang, Luchang Ding, Lei Shen, Jun Yu, Yaqing Chi
Implementation of Radiation Hardened Flip-Flops Based on Novel Fishbone Layouts. ISCAS (2022)
Jingtian Liu, Bin Liang, Jianjun Chen, Yaqing Chi, Li Yan, Yang Guo
Current mirror with charge dissipation transistor for analogue single-event transient mitigation in space application. IET Circuits Devices Syst. 15 (2) (2021)
Anquan Wu, Bin Liang, Yaqing Chi, Zhenyu Wu
Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain. Symmetry 12 (4) (2020)
Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen
MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology. IEICE Electron. Express 17 (4) (2020)
Qian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang
Research on the influences of well structure on dose rate effects in 65nm CMOS circuit. IEICE Electron. Express 17 (14) (2020)
Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen
Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. IEICE Electron. Express 16 (8) (2019)
Hengzhou Yuan, Yang Guo, Jianjun Chen, Yaqing Chi, Xi Chen, Bin Liang
28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery. IEEE Access 7 (2019)
Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen
A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area. ASICON (2019)
Jingyan Xu, Yang Guo, Ruiqiang Song, Bin Liang, Yaqing Chi
Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs. Symmetry 11 (6) (2019)
Bin Liang, Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan
Comparison of single-event upset generated by heavy ion and pulsed laser. Sci. China Inf. Sci. 60 (7) (2017)
Hongbing Tan, Haiyan Chen, Sheng Liu, Xikun Ma, Yaqing Chi
A Programmable Pre-emphasis Transmitter for SerDes in 40 nm CMOS. NCCET (2017)
Ruiqiang Song, Shuming Chen, Bin Liang, Yaqing Chi, Jianjun Chen
Modeling the impact of process and operation variations on the soft error rate of digital circuits. Sci. China Inf. Sci. 60 (12) (2017)
Chao Zhang, Jianjun Chen, Yaqing Chi, Hui Yang
Research on single-event transient mechanism in a novel SOI CMOS technology. IEICE Electron. Express 11 (18) (2014)
Honghui Sun, Liang Fang, Yao Wang, Yaqing Chi, Rulin Liu
A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact. NANOARCH (2014)
Yaqing Chi, Yibai He, Bin Liang, Chunmei Hu
A Scan Chain Based SEU Test Method for Microprocessors. NCCET (2013)
Bingcai Sui, Liang Fang, Yaqing Chi, Chao Zhang
Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations. IET Circuits Devices Syst. 4 (5) (2010)
Bingcai Sui, Liang Fang, Yaqing Chi
Reconfigurable logic gate implemented by suspended-gate single-electron transistors. NEMS (2010)