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Yibai He
Publication Activity (10 Years)
Years Active: 2013-2015
Publications (10 Years): 0
Top Topics
Cmos Technology
Test Set
Power Dissipation
Error Rate
Top Venues
Sci. China Inf. Sci.
NCCET
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Publications
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Ruiqiang Song
,
Shuming Chen
,
Yibai He
,
Yankang Du
Flip-flops soft error rate evaluation approach considering internal single-event transient.
Sci. China Inf. Sci.
58 (6) (2015)
Yibai He
,
Shuming Chen
Comparison of heavy-ion induced SEU for D- and TMR-flip-flop designs in 65-nm bulk CMOS technology.
Sci. China Inf. Sci.
57 (10) (2014)
Yaqing Chi
,
Yibai He
,
Bin Liang
,
Chunmei Hu
A Scan Chain Based SEU Test Method for Microprocessors.
NCCET
(2013)