A Scan Chain Based SEU Test Method for Microprocessors.
Yaqing ChiYibai HeBin LiangChunmei HuPublished in: NCCET (2013)
Keyphrases
- similarity measure
- mutual information
- clustering method
- pairwise
- neural network
- multiresolution
- cost function
- computing power
- evaluation method
- test data
- matching algorithm
- binary images
- error rate
- detection method
- main contribution
- theoretical analysis
- model selection
- support vector machine
- experimental evaluation
- feature space
- preprocessing