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Ruiqiang Song
ORCID
Publication Activity (10 Years)
Years Active: 2015-2021
Publications (10 Years): 10
Top Topics
Metal Oxide Semiconductor
E Learning
Error Rate
Flip Flops
Top Venues
ASICON
Sci. China Inf. Sci.
IEICE Electron. Express
Symmetry
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Publications
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Ruiqiang Song
,
Jiageng Shi
,
Jinjin Shao
,
Xiaoyu Zhang
Machine Learning based SET Propagation Prediction for Large Scale Integrated Circuits.
ASICON
(2021)
Ruiqiang Song
,
Jinjin Shao
,
Bin Liang
,
Yaqing Chi
,
Jianjun Chen
MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology.
IEICE Electron. Express
17 (4) (2020)
Ruiqiang Song
,
Jinjin Shao
,
Bin Liang
,
Yaqing Chi
,
Jianjun Chen
Characterization of P-hit and N-hit single-event transient using heavy ion microbeam.
IEICE Electron. Express
16 (8) (2019)
Xiaoyu Zhang
,
Bin Liang
,
Ruiqiang Song
Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient.
ASICON
(2019)
Ruiqiang Song
,
Jinjin Shao
,
Bin Liang
,
Yaqing Chi
,
Jianjun Chen
A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area.
ASICON
(2019)
Jingyan Xu
,
Yang Guo
,
Ruiqiang Song
,
Bin Liang
,
Yaqing Chi
Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs.
Symmetry
11 (6) (2019)
Bin Liang
,
Ruiqiang Song
,
Jianwei Han
,
Yaqing Chi
,
Rui Chen
,
Chunmei Hu
,
Jianjun Chen
,
Yingqi Ma
,
Shipeng Shangguan
Comparison of single-event upset generated by heavy ion and pulsed laser.
Sci. China Inf. Sci.
60 (7) (2017)
Ruiqiang Song
,
Shuming Chen
,
Bin Liang
,
Yaqing Chi
,
Jianjun Chen
Modeling the impact of process and operation variations on the soft error rate of digital circuits.
Sci. China Inf. Sci.
60 (12) (2017)
Jingyan Xu
,
Shuming Chen
,
Pengcheng Huang
,
Peipei Hao
,
Ruiqiang Song
,
Chunmei Hu
Single event transient propagation in dynamic complementary metal oxide semiconductor cascade circuits.
IEICE Electron. Express
12 (23) (2015)
Ruiqiang Song
,
Shuming Chen
,
Yibai He
,
Yankang Du
Flip-flops soft error rate evaluation approach considering internal single-event transient.
Sci. China Inf. Sci.
58 (6) (2015)