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V. Bharath Sreenivasulu
ORCID
Publication Activity (10 Years)
Years Active: 2021-2024
Publications (10 Years): 7
Top Topics
High Speed
Shortest Path
Nm Technology
Quantitative Evaluation
Top Venues
IEEE Access
Microelectron. J.
ICCCNT
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Publications
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V. Bharath Sreenivasulu
,
Aruna Kumari Neelam
,
Asisa Kumar Panigrahy
,
Lokesh Vakkalakula
,
Jawar Singh
,
Shiv Govind Singh
Benchmarking of Multi-Bridge-Channel FETs Toward Analog and Mixed-Mode Circuit Applications.
IEEE Access
12 (2024)
Aruna Kumari Neelam
,
V. Bharath Sreenivasulu
,
Vikas Vijayvargiya
,
Abhishek Kumar Upadhyay
,
J. Ajayan
,
M. Uma
Performance Comparison of Nanosheet FET, CombFET, and TreeFET: Device and Circuit Perspective.
IEEE Access
12 (2024)
Asisa Kumar Panigrahy
,
Veera Venkata Sai Amudalapalli
,
Depuru Shobha Rani
,
Muralidhar Nayak Bhukya
,
Hima Bindu Valiveti
,
V. Bharath Sreenivasulu
,
Raghunandan Swain
Spacer Dielectric Analysis of Multi-Channel Nanosheet FET for Nanoscale Applications.
IEEE Access
12 (2024)
V. Bharath Sreenivasulu
,
Aruna Kumari Neelam
,
Sekhar Reddy Kola
,
Jawar Singh
,
Yiming Li
Exploring the Performance of 3-D Nanosheet FET in Inversion and Junctionless Modes: Device and Circuit-Level Analysis and Comparison.
IEEE Access
11 (2023)
B. Mounika
,
J. Ajayan
,
Sandip Bhattacharya
,
D. Nirmal
,
V. Bharath Sreenivasulu
,
N. Aruna Kumari
Investigation on effect of AlN barrier thickness and lateral scalability of Fe-doped recessed T-gate AlN/GaN/SiC HEMT with polarization-graded back barrier for future RF electronic applications.
Microelectron. J.
140 (2023)
Aruru Sai Kumar
,
M. Deekshana
,
V. Bharath Sreenivasulu
,
Rajendra Prasad Somineni
,
D. Kanthi Sudha
Characterization for Sub-5nm Technology Nodes of Junctionless Gate-All-Around Nanowire FETs.
ICCCNT
(2022)
V. Bharath Sreenivasulu
,
Vadthiya Narendar
Characterization and optimization of junctionless gate-all-around vertically stacked nanowire FETs for sub-5 nm technology nodes.
Microelectron. J.
116 (2021)