Siyad C. Ma

Publication Activity (10 Years)

Years Active: 1992-1999
Publications (10 Years): 0

Publications

R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma
A comparison of bridging fault simulation methods. ITC (1999)
R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma
Testability Features of the AMD-K6 Microprocessor. IEEE Des. Test Comput. 15 (3) (1998)
R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma
Microprocessor. ITC (1997)
Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell
Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC (1996)
Siyad C. Ma, Edward J. McCluskey
Open faults in BiCMOS gates. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14 (5) (1995)
Siyad C. Ma, Piero Franco, Edward J. McCluskey
An Experimental Chip to Evaluate Test Techniques: Experiment Results. ITC (1995)
Siyad C. Ma, Edward J. McCluskey
Open faults in BiCMOS gates. VTS (1994)
Siyad C. Ma, Edward J. McCluskey
Non-Conventional Faults in BiCMOS Digital Circuits. ITC (1992)