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Analysis and Detection of Timing Failures in an Experimental Test Chip.

Piero FrancoSiyad C. MaJonathan ChangYi-Chin ChuSanjay WattalEdward J. McCluskeyRobert L. StokesWilliam D. Farwell
Published in: ITC (1996)
Keyphrases
  • data analysis
  • object detection
  • high speed
  • statistical analysis
  • quantitative analysis
  • database
  • object recognition
  • false positives
  • event detection
  • detection accuracy