Piero Franco

Publication Activity (10 Years)

Years Active: 1991-1996
Publications (10 Years): 0

Publications

Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, William D. Farwell
Analysis and Detection of Timing Failures in an Experimental Test Chip. ITC (1996)
Piero Franco, William D. Farwell, Robert L. Stokes, Edward J. McCluskey
An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design. ITC (1995)
Siyad C. Ma, Piero Franco, Edward J. McCluskey
An Experimental Chip to Evaluate Test Techniques: Experiment Results. ITC (1995)
Piero Franco, Edward J. McCluskey
Three-pattern tests for delay faults. VTS (1994)
Piero Franco, Edward J. McCluskey
On-line delay testing of digital circuits. VTS (1994)
Nirmal R. Saxena, Piero Franco, Edward J. McCluskey
Simple Bounds on Serial Signature Analysis Aliasing for Random Testing. IEEE Trans. Computers 41 (5) (1992)
Piero Franco, Edward J. McCluskey
Delay Testing of Digital Circuits by Output Waveform Analysis. ITC (1991)
Nirmal R. Saxena, Piero Franco, Edward J. McCluskey
Bounds on Signature Analysis Aliasing for Random Testing. FTCS (1991)
Nirmal R. Saxena, Piero Franco, Edward J. McCluskey
Refined Bounds on Signature Analysis Aliasing for Random Testing. ITC (1991)