Testability Features of the AMD-K6 Microprocessor.

R. Scott Fetherston Imtiaz P. Shaik Siyad C. Ma

Published in: IEEE Des. Test Comput. (1998)

Keyphrases

feature vectors
co occurrence
structural information
computer vision
feature selection
feature extraction
feature space
support vector machine
image classification
video data
false positives
spatial information
classification models
feature detection
multiple features