Open faults in BiCMOS gates.

Siyad C. Ma Edward J. McCluskey

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)

Keyphrases

fault diagnosis
fault detection
multiple faults
artificial neural networks
database
neural network
information retrieval
artificial intelligence
face recognition
objective function
data structure
low cost
test cases
integrated circuit