S. G. Mhaisalkar

Publication Activity (10 Years)

Years Active: 2004-2006
Publications (10 Years): 0

Publications

M. Y. Yan, King-Ning Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects. Microelectron. Reliab. 46 (8) (2006)
Hung Son Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang
Reliability studies of barrier layers for Cu/PAE low-k interconnects. Microelectron. Reliab. 46 (8) (2006)
A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
Electromigration behavior of dual-damascene Cu interconnects--Structure, width, and length dependences. Microelectron. Reliab. 44 (5) (2004)