V. Chandrasekar

Publication Activity (10 Years)

Years Active: 2006-2006
Publications (10 Years): 0

Publications

Hung Son Nguyen, Z. H. Gan, Zhe Chen, V. Chandrasekar, K. Prasad, S. G. Mhaisalkar, Ning Jiang
Reliability studies of barrier layers for Cu/PAE low-k interconnects. Microelectron. Reliab. 46 (8) (2006)