A. V. Vairagar

Publication Activity (10 Years)

Years Active: 2004-2006
Publications (10 Years): 0

Publications

M. Y. Yan, King-Ning Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects. Microelectron. Reliab. 46 (8) (2006)
A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
Electromigration behavior of dual-damascene Cu interconnects--Structure, width, and length dependences. Microelectron. Reliab. 44 (5) (2004)