M. Y. Yan

Publication Activity (10 Years)

Years Active: 2006-2006
Publications (10 Years): 0

Publications

M. Y. Yan, King-Ning Tu, A. V. Vairagar, S. G. Mhaisalkar, Ahila Krishnamoorthy
A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects. Microelectron. Reliab. 46 (8) (2006)