Rob Wadsworth

Publication Activity (10 Years)

Years Active: 2003-2005
Publications (10 Years): 0

Publications

Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Rob Wadsworth
Impact of stresses on the fault coverage of memory tests. MTDT (2005)
Ad J. van de Goor, Said Hamdioui, Rob Wadsworth
Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. ITC (2004)
Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor
Memory Fault Modeling Trends: A Case Study. J. Electron. Test. 20 (3) (2004)
Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor
Importance of dynamic faults for new SRAM technologies. ETW (2003)