John Delos Reyes

Publication Activity (10 Years)

Years Active: 2003-2004
Publications (10 Years): 0

Publications

Said Hamdioui, John Delos Reyes, Zaid Al-Ars
Evaluation of Intra-Word Faults in Word-Oriented RAMs. Asian Test Symposium (2004)
Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor
Memory Fault Modeling Trends: A Case Study. J. Electron. Test. 20 (3) (2004)
Said Hamdioui, Rob Wadsworth, John Delos Reyes, Ad J. van de Goor
Importance of dynamic faults for new SRAM technologies. ETW (2003)