Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests.

Ad J. van de Goor Said Hamdioui Rob Wadsworth

Published in: ITC (2004)

Keyphrases

test cases
evaluation method
genetic algorithm
case study
fuzzy logic
power consumption
evaluation process
high speed
software development
automatic detection
low power
evaluation metrics
data transmission
evaluation model
quantum computing
random access memory