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Impact of stresses on the fault coverage of memory tests.

Said HamdiouiZaid Al-ArsAd J. van de GoorRob Wadsworth
Published in: MTDT (2005)
Keyphrases
  • memory requirements
  • memory space
  • databases
  • real world
  • information technology
  • high speed
  • computational power
  • low memory
  • real time
  • information systems
  • lower bound