Mohamed H. Abu-Rahma

Publication Activity (10 Years)

Years Active: 2005-2013
Publications (10 Years): 0

Top Topics

Correlation Analysis

Evolutionary Algorithm

Image Enhancement

Top Venues

Publications

Animesh Datta, Mohamed H. Abu-Rahma, Sachin Dileep Dasnurkar, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu
Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology. ISQED (2013)
Sachin Dileep Dasnurkar, Animesh Datta, Mohamed H. Abu-Rahma, Hieu Nguyen, Martin Villafana, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu
Experiments and analysis to characterize logic state retention limitations in 28nm process node. VTS (2013)
Mohamed H. Abu-Rahma, Ying Chen, Wing Sy, Wee Ling Ong, Leon Yeow Ting, Sei Seung Yoon, Michael Han, Esin Terzioglu
Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS. CICC (2011)
Rajamani Sethuram, Karim Arabi, Mohamed H. Abu-Rahma
Leakage power profiling and leakage power reduction using DFT hardware. VTS (2011)
Mohamed H. Abu-Rahma, Mohab Anis, Sei Seung Yoon
Reducing SRAM Power Using Fine-Grained Wordline Pulsewidth Control. IEEE Trans. Very Large Scale Integr. Syst. 18 (3) (2010)
Mohamed H. Abu-Rahma, Mohab Anis, Sei Seung Yoon
A robust single supply voltage SRAM read assist technique using selective precharge. ESSCIRC (2008)
Mohamed H. Abu-Rahma, Kinshuk Chowdhury, Joseph Wang, Zhiqin Chen, Sei Seung Yoon, Mohab Anis
A methodology for statistical estimation of read access yield in SRAMs. DAC (2008)
Mohamed H. Abu-Rahma, Mohab Anis
A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (11) (2008)
Mohamed H. Abu-Rahma, Mohab Anis
Variability in VLSI Circuits: Sources and Design Considerations. ISCAS (2007)
Mohab Anis, Mohamed H. Abu-Rahma
Leakage Current Variability in Nanometer Technologies, invited. IWSOC (2005)