Experiments and analysis to characterize logic state retention limitations in 28nm process node.
Sachin Dileep DasnurkarAnimesh DattaMohamed H. Abu-RahmaHieu NguyenMartin VillafanaHadi RasouliSean TamjidiMing CaiSamit SenguptaP. R. ChidambaramRaghavan ThirumalaNikhil KulkarniPrasanna SeeramPrasad BhadriPrayag PatelSei Seung YoonEsin TerziogluPublished in: VTS (2013)