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Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology.

Animesh DattaMohamed H. Abu-RahmaSachin Dileep DasnurkarHadi RasouliSean TamjidiMing CaiSamit SenguptaP. R. ChidambaramRaghavan ThirumalaNikhil KulkarniPrasanna SeeramPrasad BhadriPrayag PatelSei Seung YoonEsin Terzioglu
Published in: ISQED (2013)
Keyphrases
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  • correlation analysis
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