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Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS.
Mohamed H. Abu-Rahma
Ying Chen
Wing Sy
Wee Ling Ong
Leon Yeow Ting
Sei Seung Yoon
Michael Han
Esin Terzioglu
Published in:
CICC (2011)
Keyphrases
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power consumption
cmos technology
low power
prediction accuracy
random access memory
nm technology
prediction model
input data
high power
low cost
prediction error
high speed
low voltage
prediction algorithm
silicon on insulator
image sensor
power supply
parallel processing
real time