Mijung Noh

Publication Activity (10 Years)

Years Active: 2016-2024
Publications (10 Years): 9

Top Topics

Digital Circuits

High Reliability

False Positives

Detection Accuracy

Top Venues

Hot Chips Symposium

Publications

Kwanyeob Chae, Jaegeun Song, Yoonjae Choi, Jiyeon Park, Billy Koo, Jihun Oh, Shinyoung Yi, Won Lee, Dongha Kim, Kyeongkeun Kang, Eunsu Kim, Juyoung Kim, Sanghune Park, Sungcheol Park, Mijung Noh, Hyo-Gyuem Rhew, Jongshin Shin
A 4-nm 1.15 TB/s HBM3 Interface With Resistor-Tuned Offset Calibration and In Situ Margin Detection. IEEE J. Solid State Circuits 59 (1) (2024)
Kwanyeob Chae, Jiyeon Park, Jaegeun Song, Billy Koo, Jihun Oh, Shinyoung Yi, Won Lee, Dongha Kim, Taekyung Yeo, Kyeongkeun Kang, Sangsoo Park, Eunsu Kim, Sukhyun Jung, Sanghune Park, Sungcheol Park, Mijung Noh, Hyo-Gyuem Rhew, Jongshin Shin
A 4nm 1.15TB/s HBM3 Interface with Resistor-Tuned Offset-Calibration and In-Situ Margin-Detection. ISSCC (2023)
Sangsoon Im, Giha Nam, Sungcheol Park, Mijung Noh
Advanced safety test solution for automotive SoC based on In-System-Test architecture. ISCAS (2022)
Seungwon Lee, JuHyung Hong, Chulseung Lee, Sandeep Vallabhaneni, SoonGon Kim, Yong Jin Shin, Mijung Noh, Soon-jae Won, Soonbok Jang, Yong Ho Song
High Performance Low Power Controller for Data Center SSDs. HCS (2021)
Christopher Gonzalez, Huichu Liu, Mijung Noh, Eric Karl, Thomas Toifl, Shawn Hsu
F5: Enabling New System Architectures with 2.5D, 3D, and Chiplets. ISSCC (2021)
Arijit Raychowdhury, Mijung Noh, Keith A. Bowman
Session 35 Overview: Adaptive Digital Techniques for Variation Tolerant Systems Digital Circuits Subcommittee. ISSCC (2021)
Jian Ouyang, Mijung Noh, Yong Wang, Wei Qi, Yin Ma, Canghai Gu, SoonGon Kim, Ki-il Hong, Wang-Keun Bae, Zhibiao Zhao, Jing Wang, Peng Wu, Xiaozhang Gong, Jiaxin Shi, Hefei Zhu, Xueliang Du
Baidu Kunlun An AI processor for diversified workloads. Hot Chips Symposium (2020)
Yunhyeok Choi, Bohdan Karpinskyy, Kyoung-Moon Ahn, Yongsoo Kim, Soonkwan Kwon, Jieun Park, Yongki Lee, Mijung Noh
27.4 Physically Unclonable Function in 28nm FD801 Technology Achieving High Reliability for AEC-Q100 Grade 1 and 1SO26262 ASIL-B. ISSCC (2020)
Bohdan Karpinskyy, Yongki Lee, Yunhyeok Choi, Yongsoo Kim, Mijung Noh, Sanghyun Lee
8.7 Physically unclonable function for secure key generation with a key error rate of 2E-38 in 45nm smart-card chips. ISSCC (2016)